EDM1-IMX6 HARDWARE MANUAL
– VER 1.00 – NOV 14 2019
Page
32
of
80
2.8 JTAG Connector
The EDM1-IMX6 JTAG interface is derived from the i.MX6 processor integrated SJC module.
The SJC module implements and manages the daisy-
chained topology consisting of its’ own TAP and
those of the SDMA, and the ARM Debug Access Port (DAP).
The SJC supports the following main features:
•
IEEE P1149.1, 1149.6 (standard JTAG) interface to off-chip test and development equipment
•
Debug-related control and status
For additional details, please re
fer to the SJC chapter of the “i.MX6 Reference Manual”.
Table 9 - JTAG Expansion Header Signal Description
Pin #
i.MX6
BALL
Signal
V
I/O
Description
1
3.3V
3.3V
P
Power Supply 3.3VDC
2
C2
JTAG_nTRST
I
Test Reset (TRST). This is used to asynchronously
initialize the test controller. The TRST pin has an internal
pull-up resistor
3
C3
JTAG_TMS
I
Test Mode Select (TMS). This is used to sequence the
test controller's state machine. TMS is sampled on the
rising edge of TCK and includes an internal pull-up
resistor
4
G5
JTAG_TDI
I
Test Data Input (TDI). Serial test instruction and data are
received through the test data input (TDI) pin. TDI is
sampled on the rising edge of TCK and includes an
internal pull-up resistor
5
G6
JTAG_TDO
O
Test Data Output (TDO). The serial output for test
instructions and data. TDO is tri-stat able and is actively
driven in the shift-IR and shift-DR controller states. TDO
changes on the falling edge of TCK
6
C11
JTAG_nSRST
I
System Reset (SRST). This is used to asynchronously
initialize the test controller. The SRST pin has an internal
pull-up resistor