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Semiconductor Group
44
On-Chip Peripheral Components
7.1.4
Port Handling
7.1.4.1 Port Timing
When executing an instruction that changes the value of a port latch, the new value arrives at the
latch during S6P2 of the final cycle of the instruction. However, port latches are only sampled by
their output buffers during phase 1 of any clock period (during phase 2 the output buffer holds the
value it noticed during the previous phase 1). Consequently, the new value in the port latch will not
appear at the output pin until the next phase 1, which will be at S1P1 of the next machine cycle.
When an instruction reads a value from a port pin (e.g. MOV A, P1) the port pin is actually sampled
in state 5 phase 1 or phase 2 depending on port and alternate functions. Figure 7-6 illustrates this
port timing. lt must be noted that this mechanism of sampling once per machine cycle is also used
if a port pin is to detect an "edge", e.g. when used as counter input. In this case an "edge" is
detected when the sampled value differs from the value that was sampled the cycle before.
Therefore, there must be met certain requirements on the pulse length of signals in order to avoid
signal "edges" not being detected. The minimum time period of high and low level is one machine
cycle, which guarantees that this logic level is noticed by the port at least once.
Figure 7-6
Port Timing
*
Содержание SAB 80515 Series
Страница 9: ...Semiconductor Group 9 Introduction Figure 1 2 Block Diagram ...
Страница 12: ...Semiconductor Group 12 Fundamental Structure Figure 2 1 Detailed Block Diagram ...
Страница 18: ...Semiconductor Group 18 Central Processing Unit Figure 3 1 Fetch Execute Sequence ...
Страница 22: ...Semiconductor Group 22 Memory Organization Figure 4 3 Mapping of the Lower Portion of the Internal Data Memory ...
Страница 30: ...Semiconductor Group 30 External Bus Interface Figure 5 1 a and b External Program Memory Execution ...
Страница 38: ...Semiconductor Group 38 On Chip Peripheral Components Figure 7 3 Output Driver Circuits of Ports 1 through 5 ...
Страница 59: ...Semiconductor Group 59 On Chip Peripheral Components Figure 7 16 a Functional Diagram Serial Interface Mode 0 ...
Страница 60: ...Semiconductor Group 60 On Chip Peripheral Components Figure 7 16 b Timing Diagram Serial Interface Mode 0 ...
Страница 61: ...Semiconductor Group 61 On Chip Peripheral Components Figure 7 17 a Functional Diagram Serial Interface Mode 1 ...
Страница 62: ...Semiconductor Group 62 On Chip Peripheral Components Figure 7 17 b Timing Diagram Serial Interface Mode 1 ...
Страница 73: ...Semiconductor Group 73 On Chip Peripheral Components Figure 7 25 A D Converter Block Diagram ...
Страница 83: ...Semiconductor Group 83 On Chip Peripheral Components Figure 7 33 a Timer 2 Block Diagram ...
Страница 111: ...Semiconductor Group 111 On Chip Peripheral Components Figure 7 54 Timing Diagram System Clock Output ...
Страница 113: ...Semiconductor Group 113 Interrupt System Figure 8 1 a Interrupt Structure of the SAB 80 C 515 80 C 535 ...
Страница 114: ...Semiconductor Group 114 Interrupt System Figure 8 1 b Interrupt Structure of the SAB 80 C 515 80 C 535 cont d ...
Страница 204: ...Semiconductor Group 204 Instruction Set XCH A Ri Operation XCH A Ri Bytes 1 Cycles 1 Encoding 1 1 0 0 0 1 1 i ...
Страница 215: ...Device Specifications Semiconductor Group 215 ...
Страница 217: ...Device Specifications Semiconductor Group 217 Pin Configuration P LCC 68 ...
Страница 219: ...Device Specifications Semiconductor Group 219 Logic Symbol ...
Страница 226: ...Device Specifications Semiconductor Group 226 Figure 1 Block Diagram ...
Страница 229: ...Device Specifications Semiconductor Group 229 Figure 2 Memory Address Spaces ...
Страница 239: ...Device Specifications Semiconductor Group 239 Figure 4 Block Diagram of the A D Converter ...
Страница 241: ...Device Specifications Semiconductor Group 241 Figure 5 Interrupt Request Sources ...
Страница 242: ...Device Specifications Semiconductor Group 242 Figure 6 Interrupt Priority Level Structure ...
Страница 268: ...Device Specifications Semiconductor Group 268 AC Testing Input Output Waveforms AC Testing Float Waveforms ...