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Device Specifications
Semiconductor Group
222
P1.7-P1.0 29-36
24-31
I/O
Port 1
is an 8-bit bidirectional I/O port with
internal pullup resistors. Port 1 pins that
have 1’s written to them are pulled high by
the internal pullup resistors, and in that
state can be used as inputs. As inputs,
port 1 pins being externally pulled low will
source current (
I
I L
in the DC
characteristics) because of the internal
pullup resistors. The port is used for the
low-order address byte during program
verification. Port 1 also contains the
interrupt, timer, clock, capture and
compare pins that are used by various
options. The output latch corresponding to
a secondary function must be
programmed to a one (1) for that function
to operate (except when used for the
compare functions). The secondary
functions are assigned to the port 1 pins
as follows:
– INT3/CC0 (P1.0): interrupt 3 input/
compare 0 output/capture 0 input
– INT4/CC1 (P1.1): interrupt 4 input/
compare 1 output/capture 1 input
– INT5/CC2 (P1.2): interrupt 5 input/
compare 2 output/capture 2 input
– INT6/CC3 (P1.3): interrupt 6 input/
compare 3 output/capture 3 input
– INT2 (P1.4): interrupt 2 input
– T2EX (P1.5): timer 2 external reload
trigger input
– CLKOUT (P1.6): system clock output
– T2 (P1.7): counter 2 input
Pin Definitions and Functions (cont’d)
Symbol
Pin
P-LCC-68
Pin
P-MQFP-80
Input (I)
Output (O)
Function
*
Содержание SAB 80515 Series
Страница 9: ...Semiconductor Group 9 Introduction Figure 1 2 Block Diagram ...
Страница 12: ...Semiconductor Group 12 Fundamental Structure Figure 2 1 Detailed Block Diagram ...
Страница 18: ...Semiconductor Group 18 Central Processing Unit Figure 3 1 Fetch Execute Sequence ...
Страница 22: ...Semiconductor Group 22 Memory Organization Figure 4 3 Mapping of the Lower Portion of the Internal Data Memory ...
Страница 30: ...Semiconductor Group 30 External Bus Interface Figure 5 1 a and b External Program Memory Execution ...
Страница 38: ...Semiconductor Group 38 On Chip Peripheral Components Figure 7 3 Output Driver Circuits of Ports 1 through 5 ...
Страница 59: ...Semiconductor Group 59 On Chip Peripheral Components Figure 7 16 a Functional Diagram Serial Interface Mode 0 ...
Страница 60: ...Semiconductor Group 60 On Chip Peripheral Components Figure 7 16 b Timing Diagram Serial Interface Mode 0 ...
Страница 61: ...Semiconductor Group 61 On Chip Peripheral Components Figure 7 17 a Functional Diagram Serial Interface Mode 1 ...
Страница 62: ...Semiconductor Group 62 On Chip Peripheral Components Figure 7 17 b Timing Diagram Serial Interface Mode 1 ...
Страница 73: ...Semiconductor Group 73 On Chip Peripheral Components Figure 7 25 A D Converter Block Diagram ...
Страница 83: ...Semiconductor Group 83 On Chip Peripheral Components Figure 7 33 a Timer 2 Block Diagram ...
Страница 111: ...Semiconductor Group 111 On Chip Peripheral Components Figure 7 54 Timing Diagram System Clock Output ...
Страница 113: ...Semiconductor Group 113 Interrupt System Figure 8 1 a Interrupt Structure of the SAB 80 C 515 80 C 535 ...
Страница 114: ...Semiconductor Group 114 Interrupt System Figure 8 1 b Interrupt Structure of the SAB 80 C 515 80 C 535 cont d ...
Страница 204: ...Semiconductor Group 204 Instruction Set XCH A Ri Operation XCH A Ri Bytes 1 Cycles 1 Encoding 1 1 0 0 0 1 1 i ...
Страница 215: ...Device Specifications Semiconductor Group 215 ...
Страница 217: ...Device Specifications Semiconductor Group 217 Pin Configuration P LCC 68 ...
Страница 219: ...Device Specifications Semiconductor Group 219 Logic Symbol ...
Страница 226: ...Device Specifications Semiconductor Group 226 Figure 1 Block Diagram ...
Страница 229: ...Device Specifications Semiconductor Group 229 Figure 2 Memory Address Spaces ...
Страница 239: ...Device Specifications Semiconductor Group 239 Figure 4 Block Diagram of the A D Converter ...
Страница 241: ...Device Specifications Semiconductor Group 241 Figure 5 Interrupt Request Sources ...
Страница 242: ...Device Specifications Semiconductor Group 242 Figure 6 Interrupt Priority Level Structure ...
Страница 268: ...Device Specifications Semiconductor Group 268 AC Testing Input Output Waveforms AC Testing Float Waveforms ...