Use the reflectance image as an indicator when adjusting the exposure time. Adjust the
Exposure time
in the
Laser profile extraction
parameter section.
•
If the exposure time is too low, the objects in the reflectance image contain dark
regions or regions with missing data. See
.
•
If the exposure time is too high, the objects contain bright saturated areas and
artifacts. See
.
Figure 46: Low exposure
time
Figure 47: Normal exposure
time
Figure 48: High exposure
time
8.6.1.2
Scatter
The scatter component measures the intensity of the laser signal in defined parts of
the Window Around Maximum (
WAM Size
),
. The scatter signal
can be explained as the amount of scattered light received in a sampling window at a
distance from the peak laser position.
Figure 49: Wooden board displayed with reflectance (left) and scatter (right). The knots and the
blue-stained right edge of the board (denoted in blue) appear dark in the scatter image.
Scatter measurements can distinguish material effects, which is useful for organic mat‐
ters such as wood (wood fibers transmit light along their growth direction, and knots
and rot affect this property) and meat (fat, bone, and meat have different scattering
properties). In some cases, scattering can reveal sub-surface effects like delamination
or the content of cavities beneath a surface.
The default pixel format for scatter is 16 bits. This is due to the large dynamic range of
the scatter signal, which sums up to 29 individual 8-bit pixel values.
Basic scatter parameters
The scatter component measures the amount of light received in a defined sampling
window, which is part of the extracted 31-row WAM window. The amount of light is
added for all rows in the sampling window to get the total scattering value.
Select the
Scatter
checkbox to add scatter data to the image data. The sampling window
is defined by the following parameters:
CONFIGURATION
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