10.3
Date Code 20050919
Instruction Manual
SEL-387-0, -5, -6 Relay
Testing and Troubleshooting
Testing Methods and Tools
Figure 10.1
Low-Level Test Interface
Test Methods
Test the pickup and dropout of relay elements using one of three methods:
➤
Front-panel target LCD/LED indication
➤
Output contact operation
➤
Sequential Events Recorder (SER)
Target LED Illumination
During testing, use target LED illumination to determine relay element status.
Using the
TAR F
command, set the front-panel targets to display the element
under test. Monitor element pickup and dropout by observing the target LEDs.
For example, the Winding 1 phase definite-time overcurrent element 50P11
appears in Relay Word Row 2. When you type the command
TAR F 50P11
<Enter>
, the terminal displays the labels and status for each bit in the Relay
Word row (2) and the LEDs display their status. Thus, with these new targets
displayed, if the Winding 1 phase definite-time overcurrent element (50P11)
asserts, the far left LED illuminates. See
all Relay Word elements.
Be sure to reset the front-panel targets to the default targets after testing before
returning the relay to service. This can be done by pressing the front-panel
{TARGET RESET}
pushbutton or by issuing the
TAR R
command from the serial
port.
Output Contact Operation
To test using this method, set one programmable output contact to assert when
the element under test picks up. With the
SET
n
command, enter the Relay
Word bit name of the element under test.
For an a contact, when the condition asserts, the output contact closes. When
the condition deasserts, the output contact opens.
For a b contact, when the condition asserts, the output contact opens. When
the condition deasserts, the output contact closes.
Programmable contacts can be changed to a or b contacts with a solder
jumper. Refer to
for jumper locations. Using contact
operation as an indicator, you can measure element operating characteristics,
stop timers, etc.
Tests in this section assume an a output contact.
1.25 Vdc AT NOMINAL 125 Vdc BATTERY
SEL-387 157-0022
GND
VBAT
GND GND
GND
GND
IBW3
ICW3
IAW4
IBW4
LOW-LEVEL TEST INTERFACE
IAW1
GND
IBW1
ICW1
GND GND
GND
IBW2
ICW2
GND
IAW3
GND
ICW4
GND
GND
GND
N/C
GND
+15V
+15V
-15V
-15V
U.S. PATENT 5,479,315
PROCESSING MODULE INPUT (J10) : 9 V p-p MAXIMUM
IAW2
GND
INPUT MODULE OUTPUT (J13) : 100 mV AT NOMINAL CURRENT (1 A OR 5 A)
Содержание SEL-387-0
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