QuadTech Sentry Plus Series, Инструкция по эксплуатации

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Operation Page 45 of 85
2.9 Storing a Test Setup
NOTE:
Instrument PRESET values can be programmed and stored for your specific test setup. Therefore
before storing your tests, program the preset values. Refer to p 2.11 for PRESET programming
information.
To store the previous example of the programmed 5-step test, with the instrument in ‘STAND
BY’ status, press [F3] = MENU to access the memory function.
In MENU with the highlighted box around MEMORY, press [F3] = SELECT to enter the
memory function.
Press [F1] = STORE to access the store function. Press [F2] = DOWN to move highlighted box
to the memory location (1-60) in which you wish to store this test setup. Press [F3] = SELECT
to accept location number.
LAST
DOWN
EXIT
SELECT
RMT ERR OFST LOCK SELECT FUNC.
1
5
4
3
2
MEMORY
KEY LOCK
CALIBRATION
OPTION
SYSTEM
F1
F4
F3
F2
To enter programming mode.
To view/change preset (initial) test
parameters.
To view/change system parameters:
memory, system, option, calibration, key
lock, password, error, & about.
To view the programmed test setups and
access offset function.
PROGRAM
PRESET
MORE..
MENU
RMT ERR OFST LOCK STAND BY
0.1A
0.5s
1.2
Ω
F1
F4
F3
F2
LOW GC STEP 1/5 0.3
Ω
:
STAND BY
Display
MENU
To enter MEMORY function.
Return to STAND BY display.
To toggle through MENU functions.
To toggle through MENU functions.
STORE
RECALL
RETURN
DELETE
RMT ERR OFST LOCK SELECT FUNC.
1
5
4
3
2
(0 STEPS)
(0 STEPS)
(0 STEPS)
(0 STEPS)
(0 STEPS)
F1
F4
F3
F2
To store a test setup in memory
location 1-60
MEMORY
Return to MENU display.
Delete test in highlighted location.
Recall test in highlighted location.
LAST
DOWN
RETURN
SELECT
RMT ERR OFST LOCK SEL. MEMORY
1
5
4
3
2
(0 STEPS)
(0 STEPS)
(0 STEPS)
(0 STEPS)
(0 STEPS)
F1
F4
F3
F2
To move highlighted box to
memory location 60
To select highlighted memory
location and store previously
programmed test setup
Select
LOCATION
To toggle through memory
locations 1-60