
26
Note:
When making a measurement, the meter will ignore any triggers it
receives until the current measurement is complete.
Store and Recall
The STO and RCL buttons allow nine complete instrument setups to be saved in
nonvolatile memory. All the test conditions, including binning, configuration and
open short circuit compensation, are saved.
To store a setup,
1. Press the
STO
button, which will display the “store” message.
2. Press the number where the setting is to be stored ([1]
–[9]), then press the
ENTER
button.
To recall a stored setting,
1. Press the
RCL
button, which will display “rcl”.
2. Press the number where the setting is stored ([1]
–[9]), and then press the
ENTER
button
Notes
: 1.
STO
0
ENTER
will give an error since the factory default setting is
stored in location 0.
2.
RCL
0
ENTER
returns the default setup, including null calibration
values.
3.
If a “cal error 4” appears during the self-test, or a “rcl error” message
appears when recalling a setup, the stored setup was lost and must be re-
entered.
Range
The meter has four measurement ranges, designated by the numbers 0 to 3. The
range may be selected manually or the meter cans auto range. Table 3-4
specifies the impedance ranges for each of the measurement ranges. Each of
the four ranges has a source impedance of approximately the mid-scale
impedance. Note that the measurement ranges determine an impedance range
(not a parameter value range), so the ranges of inductance and capacitance
depend upon the test frequency. The parameter f is the test frequency. In
addition, the impedance of a capacitor is inversely proportional to its capacitance,
so larger capacitors are measured in the lower impedance ranges.
Table 3-4: Measurement Range and Impedance Range
Range
Source R
Resistance
Inductance
Capacitance
3
25.0
10
–100.0
0.0001
H–(15.9/f) H
99999
F–(1.59/f) mF
2
400
100.0
–1.6 k
(15.9/f) H–(255/f) H
(1.59/f) mF–(99.5/f)
F
1
6.4
1.6 k
–25.6 k
(255/f) H–(4074/f) H
(99.5/f)
F–(6.22/f)
F
0
100 k
25.6 k
–2000 M
(4074/f) H–99999H
(6.22/f)
F–0.0001pF
* f is test frequency
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