OPTO-EDU A63.7080, Инструкция по эксплуатации

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can be accurately performed.
5. Simple operation: users can perform main scan after receiving short-term training.
6. Electronics and computer science can appropriately improve image quality. For
example, the image processing modulator can improve the blackness and contrast of
the image to appropriately improve the brightness of each part of the image.
7. More image observation modes: For example, multi-channel scanning can help
users observe images from different detectors at the same time.
8. According to the observation purpose, users can conduct dynamic tests by
changing different stages such as high temperature, low temperature and traction
stage to observe the phase change and transformation under different stages
condition.
9 The scalability of the instrument is very good; users can perform multi-functional
analysis by adding different signal detection equipment, for example, can use X-ray
energy spectrometer (EDS) for micro area component analysis, or perform qualitative
and quantitative analysis in different micro areas analysis.
10. Windows operating system; friendly interface, simple and easy to master; the
image is displayed on the same screen, and can be enlarged or reduced; the image
resolution is optional; USB2.0 peripheral equipment standard communication
interface and support plug.
11. The pre-installed image processing software supports a variety of common image
formats, and can be converted between different image formats; optional image
processing software can enhance a series of image processing functions, such as
particle analysis.
1.2 Main Purpose and Scope of Application
Scanning electron microscope (SEM) can be used to observe one-dimensional,
two-dimensional and three-dimensional materials of metals, ceramics,