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NXP Semiconductors
UM11108
FRDM-GD3100EVM half-bridge evaluation board
UM11108
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© NXP B.V. 2018. All rights reserved.
User guide
Rev. 3.0 — 16 August 2018
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4.3.2 Test point definitions
All test points are clearly marked on the evaluation board.
Figure 4
shows the location of
various test points.
Figure 4. Key test point locations
Table 3. Test point definitions
Test point
Definitions
Low voltage domain
VPWR
DC voltage source connection point for VSUP power input of MC33GD3100
devices. Typically supplied by vehicle b12V DC.
GND1_1,2,3,4
Grounding points for low voltage domain
GD3100PWR
MC33GD3100 VSUP test point
VDDL
MC33GD3100 VDD test point on low-side driver. See data sheet for usage.
NJWEN
Flyback enable test point connected to NJW4140 MOSFET drive switching regulator
Low-side driver domain
VCCL
Positive voltage supply test point for isolated circuitry and low-side driver gate of
IGBT
CLAMPL
V
CE
sense test point connected to low-side driver clamp pin and circuitry
DSTL
V
CE
desaturation test point connected to low-side driver DESAT pin and circuitry
VEEL
Negative voltage supply test point for low-side driver gate of IGBT
AMXL
Analog MUX input test point for low-side driver
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