NXP Semiconductors RDGD31603PSMKEVM, Руководство пользователя, Страница: 9 / 39

NXP Semiconductors
UM11697
RDGD31603PSMKEVM three-phase inverter kit
Pin Name Function
12 PWMLW Pulse width modulation input low-side phase W
13 INTAHV GD3160 fault reporting/monitoring output pin for high-side phase V
14 AOUTLW GD3160 analog output signal low-side W phase
15 INTALV GD3160 fault reporting/monitoring output pin for low-side phase V
16 INTB_HIGH SIDE GD3160 fault reporting output all high-side gate drivers
17 INTAHW GD3160 fault reporting/monitoring output pin for high-side phase W
18 INTB_LOW SIDE GD3160 fault reporting output all low-side gate drivers
19 INTALW GD3160 fault reporting/monitoring output pin for low-side phase W
20 FSENB EXT Active-low Fail Safe control input (leave open if unused)
Table 2. External connector (J38) pin definition
...continued
4.2.3 Test points
All test points are clearly marked on the board. The following figure shows the location of
various test points.
Figure 3. RDGD31603PSMKEVM test points
Test point name Function
DSTHU DESAT high-side U phase VCE desaturation connected to DESAT pin circuitry
DSTLU DESAT low-side U phase VCE desaturation connected to DESAT pin circuitry
GHU Gate high-side U phase
GHV Gate high-side V phase
Table 3. Test points
UM11697 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved.
User manual Rev. 1 — 10 December 2021
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