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NXP Semiconductors
UM11697
RDGD31603PSMKEVM three-phase inverter kit
6 Configuring the hardware
RDGD31603PSMKEVM with KITGD3160TREVB attached as shown in
utilizing
Windows based PC and FlexGUI software.
Suggested equipment needed for test:
•
Rogowski coil high-current probe
•
High-voltage differential voltage probe
•
High sample rate digital oscilloscope with probes.
•
DC link capacitor compatible with eMPack module
•
Compatible eMPack IGBT or SiC module
•
Windows based PC
•
High-voltage DC power supply for DC link voltage
•
Low-voltage DC power supply for VSUP
+12 V DC gate drive board low-voltage domain
•
Voltmeter for monitoring high-voltage DC link supply
•
Load coil for double pulse and short-circuit testing, Phase U only
Note:
To enable short-circuit testing, two resistors (R43, R56) must be pulled from
PWMALT phase U signals to disable Deadtime control on Phase U gate drivers.
Using the FlexGUI software, it is possible to conduct double pulse and short circuit
testing on the U phase only. External PWM inputs are provided on the external
connectors, should the user want to drive these pins from their own setup. When using
external PWM inputs on the U phase, jumpers J4 and J5 on the translator board should
be disconnected to prevent a driving conflict with the KL25Z microcontroller board.
UM11697
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2021. All rights reserved.
User manual
Rev. 1 — 10 December 2021
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