NXP Semiconductors
UM11603
RDGD31603PHSEVM three-phase inverter reference design
6 Configuring the hardware
RDGD31603PHSEVM with KITGD3160TREVB attached as shown in
Windows based PC and FlexGUI software.
Note:
Double pulse and short-circuit testing can be conducted on Phase U only. See
FlexGUI Pulse Tab,
Suggested equipment needed for test:
•
Rogowski coil high-current probe
•
High-voltage differential voltage probe
•
High sample rate digital oscilloscope with probes
•
DC link capacitor compatible with HybridPACK Drive module
•
IGBT or SiC MOSFET HybridPACK Drive module
•
Windows based PC
•
High-voltage DC power supply for DC link voltage
•
Low-voltage DC power supply for VSUP
–
+12 V DC gate drive board low-voltage domain
•
Voltmeter for monitoring high-voltage DC link supply
•
Load coil for double pulse and short-circuit testing, Phase U only
Note:
To enable short-circuit testing, two resistors (R46, R53) must be pulled from
PWMALT phase U signals to disable Deadtime control on Phase U gate drivers.
Figure 33. Evaluation setup using KITGD3160TREVB and FlexGUI
UM11063
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User manual
Rev. 1 — 18 August 2021
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