Chapter 33
JTAG Controller (JTAGC)
33.1 Introduction
The JTAGC block provides the means to test chip functionality and connectivity while
remaining transparent to system logic when not in test mode. Testing is performed via a
boundary scan technique, as defined in the IEEE 1149.1-2001 standard. All data input to
and output from the JTAGC block is communicated in serial format.
33.1.1 Block diagram
The following is a simplified block diagram of the JTAG Controller (JTAGC) block.
Refer to
for more information about the JTAGC registers.
Power-on reset
TMS
TCK
TDI
1-bit Bypass Register
32-bit Device Identification Register
Boundary Scan Register
TAP Instruction Decoder
TAP Instruction Register
TDO
Test Access Port (TAP)
Controller
Figure 33-1. JTAG (IEEE 1149.1) block diagram
Kinetis KE1xF Sub-Family Reference Manual, Rev. 4, 06/2019
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