Test-Logic-Reset state results in the IDCODE instruction being loaded on the falling
edge of TCK. Asynchronous entry into the Test-Logic-Reset state results in asynchronous
loading of the IDCODE instruction. During the Capture-IR TAP controller state, the
instruction shift register is loaded with the value 0001b , making this value the register's
read value when the TAP controller is sequenced into the Shift-IR state.
R
W
Reset:
Instruction Code
2
1
0
0
0
0
1
0
0
0
1
3
Figure 33-2. Instruction register
33.3.2 Bypass register
The bypass register is a single-bit shift register path selected for serial data transfer
between TDI and TDO when the BYPASS, CLAMP, HIGHZ or reserve instructions are
active. After entry into the Capture-DR state, the single-bit shift register is set to a logic
0. Therefore, the first bit shifted out after selecting the bypass register is always a logic 0.
33.3.3 Device identification register
The device identification (JTAG ID) register, shown in the following figure, allows the
revision number, part number, manufacturer, and design center responsible for the design
of the part to be determined through the TAP. The device identification register is
selected for serial data transfer between TDI and TDO when the IDCODE instruction is
active. Entry into the Capture-DR state while the device identification register is selected
loads the IDCODE into the shift register to be shifted out on TDO in the Shift-DR state.
No action occurs in the Update-DR state.
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
R
Part Revision Number
Design Center
Part Identification Number
W
Reset
PRN
DC
PIN
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
R
Part Identification Number
Manufacturer Identity Code
1
W
Reset
PIN (contd.)
MIC
1
The following table describes the device identification register functions.
Chapter 33 JTAG Controller (JTAGC)
Kinetis KE1xF Sub-Family Reference Manual, Rev. 4, 06/2019
NXP Semiconductors
755
Содержание KE1xF Series
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