Chapter 5
Diagnostic Tests
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National Instruments Corporation
5-7
27
A24 Pointer High test
28
A24 Pointer Low test
29
A32 Pointer High test
30
A32 Pointer Low test
31
Data Extended test
32
Data High (device) test
33
Data Low (device) test
34
Data High (local) test
35
Data Low (local) test
36
Status test
37
Constrol test
38
Response test
39
ICR & ISR test
40
I/O test
41
Signal test
42
Interrupts test
43
Word Serial Protocol test
44
SYSFAIL circuitry test
Table 5-5.
MIGA Tests (Continued)
Test Number
Test Description