Chapter 5
Diagnostic Tests
5-6
ni.com
Group 3–MIGA
This group tests the MIGA registers. The MIGA, a gate array designed
by National Instruments, contains the VXI registers as defined for
Message-Based devices. Table 5-5 gives the test numbers and names
of the MIGA tests.
8
Test baud rate 75
9
Test baud rate 150
10
Test baud rate 300
11
Test baud rate 1,200
12
Test baud rate 2,400
13
Test baud rate 4,800
14
Test baud rate 9,600
15
Test baud rate 19,200
16
Baud = 9,600; test odd parity with two stop bits
17
Baud = 9,600; test even parity with two stop bits
18
Baud = 9,600; test interrupts
19
Test Timer 0 interrupt capability
20
Test Timer 1 matched mode
21
Test Timer 2 matched mode
Table 5-5.
MIGA Tests
Test Number
Test Description
22
Logical address test
23
ID test
24
Device type test
25
Offset test
26
Protocol test
Table 5-4.
68070 CPU Tests (Continued)
Test Number
Test Description
