Chapter 3
Surface zeta potential cell
Page 3-14
MAN 0487
Tracer measurement - Advanced
Refer to the
Measurement - Material
description in the
zeta potential SOPs
section of the main user manual.
Data processing
This window allows the advanced analysis parameters to be set. It is generally best
to leave these set to default.
Size ranges and measurement thresholds can be applied to the analysis to filter
spurious peaks prior to the analysis being performed. These can be setup using the
Configure
button.
SZP
displacement
(continued)
The
Tracer measurement displacement
defines the
distance from the sample at which this FFR only
measurement takes place. The displacement is altered in
125micron increments.
Settings
Description