Kikusui TOS5050A, Руководство по эксплуатации

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TOS5051A/5050A 10-3
Chap
.10
Speci
fi
cations
2
When the nominal power supply voltage can be maintained with the output
shorted.
3
Test voltage waveform:
When an AC test voltage is applied to a capacitive DUT, it is possible that the
voltage becomes higher even than that when in the no load state. Furthermore,
waveform distortion also may occur if the capacitance of the DUT is voltage-
dependent (such as of ceramics capacitors). When the test voltage is not higher
than 1.5 kV and the capacitance is not larger than 1000 pF, such test voltage
changes are only of negligible levels.
4
The heat dissipation of the high voltage generator of the DC test section is one-
tenth of the normal wattage with respect to the rated output from the viewpoint
of size, weight, and cost of the tester. Due to this, when operating the tester, pro-
vide pause periods shown in the tables below. If you operate the tester beyond
these limits, the high voltage generator will be overheated and the protector may
trip and the tester may be driven into the PROTECTION status. When this has
occurred, pause the test operation until the tester cools off and then resume the
test operation. As the tester is cooled off and the cause of the PROTECTION
status is eliminated, the tester resumes its normal operating state.
TOS5050A/TOS5051A
Ambient temperature
t (
°
C)
Upper cutoff current
I (mA)
Pause period
Maximum allowable
continuous test period
t
≤
40
°
C 50 < I
≤
110 Not less than test period
≤
30 min
I
≤
50 Not required Continuous
TOS5051A
Ambient temperature
t ( ° C)
Upper cutoff current
I (mA)
Pause period
Maximum allowable
continuous test period
t ≤ 30
° C
6 < I ≤ 11 At least 5 times of test period ≤ 30 s
6 < I ≤ 11 At least 10 times of test period ≤ 60 s
3 < I ≤ 6 At least 4 times of test period ≤ 120 s
1 < I ≤ 3 At least twice of test period ≤ 120 s
I ≤ 1 Not required Continuous
Can output up to 2 mA continuously at t < 25 ° C
30 ° C < t ≤ 35 ° C 6 < I ≤ 11 At least 10 times of test period ≤ 15 s
3 < I ≤ 6 At least 4 times of test period ≤ 30 s
2 < I ≤ 3 At least twice of test period ≤ 60 s
1 < I ≤ 2 At least twice of test period ≤ 120 s
I ≤ 1 Not required Continuous
35 ° C < t ≤ 40 ° C 1 < I ≤ 3 At least 10 times of test period ≤ 15 s
I ≤ 1 Not required Continuous