Kikusui TOS5050A, Руководство по эксплуатации

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TOS5051A/5050A 8-5
Chap
.8
Oper
ating Pr
inciple
8.3 Delay Time for Pass/Fail Judgment in DC
Mode
When testing in the DC mode a DUT which has a larger capacitance, the DUT will
draw a larger initial charge current. Lest the pass/fail judgment should be affected
by this current, a delay time is rendered before making the pass/fail judgment. The
delay time is set at approximately 0.3 seconds.
8.4 Automatic Discharge Function
When in the DC test mode, the test leads, probe, DUT and other items connected to
the output circuit can be charged up to the high DC test voltage. Even after the test
is over and the test voltage is cut off, these items can remain in the charged state for
a substantial period of time. The discharge circuit is to rapidly discharge the charges
stored in these items. When the output voltage is cut off, the discharge circuit is
automatically brought into effect and it rapidly discharges the internal output circuit
of the tester, test leads, probe, and DUT.
• Be sure to observe the following instructions when using a HV test probe
(HP01A-TOS or HP02A-TOS).
Do not disconnect the probe from the DUT while letting it deliver the test
voltage. If you do, the effects of the automatic discharge circuit may be lost
and the items on the output circuit may remain charged up to the high test
voltage. Before disconnecting the probe from the DUT, be sure that the
LED on the top of the test probe has gone out.
WARNING