K6610007
Rev.5
02.14.’03
- 70 -
(5) SMART Selective self-test Log
[Log Sector Address = 09h]
The SMART Selective self-test log is a log that may be both written and read by the host. This log allows the
host to select the parameters for the self-test and to monitor the progress of the self-test.
Following table defines the content of the Selective self-test log. The SMART Selective self-test log provides
for the definition of up to five test spans. The starting LBA for each test span is the LBA of the first sector
tested in the test span and the ending LBA for each test span is the last LBA tested in the test span. If the
starting and ending LBA values for a test span are both zero, a test span is not defined and not tested.
These values shall be written by the host. The host shall not write the SMART Selective self-test log while
the execution of a selective self-test routine is in progress.
Byte Description
0 - 1
Data structure revision number - This field shall be written as “01h” by the host.
2 - 9
Starting LBA for test span #1
10 - 17
Ending LBA for test span #1
:
:
:
:
66 - 73
Starting LBA for test span #5
74 - 81
Ending LBA for test span #5
82 - 337
Reserved - This bit shall be written as zeros by the host
338 - 491 Vendor specific - This bit shall be written as zeros by the host
492 - 499 Current LBA under test read
As the self-test progresses, the device modifies this value to contain the beginning LBA of the
65,536 sector block currently being tested. When the self-test including the off-line scan between
test spans has been completed, a zero value is placed in this field.
This field shall be written with a value of zero by the host.
500 - 501 Current span under test read
As the self-test progresses, the device modifies this value to contain the test span number of the
current span being tested. If an off-line scan between test spans is selected, a value greater
then five is placed in this field during the off-line scan. When the self-test including the off-line
scan between test spans has been completed, a zero value is placed in this field.
This field shall be written with a value of zero by the host.
502 - 503 Feature flags
bit 15 - 5 Reserved - These bits shall be written as zeros by the host
bit 4 Off-line scan active flag
When set to one, off-line scan after selective test is active. This bit shall be written as zeros by
the host and the device modifies them as the test progresses.
bit 3 Off-line scan pending flag
When set to one, off-line scan after selective test is pending. This bit shall be written as zeros
by the host and the device modifies them as the test progresses.
bit 2 Vendor specific - This bit shall be written as zeros by the host
bit 1 Perform off-line read scan after selective self-test
When set to one, perform off-line scan after selective test. This bit shall be written by the host
and returned unmodified by the device
bit 0 Vendor specific - This bit shall be written as zeros by the host
504 - 507 Vendor specific - This bit shall be written as zeros by the host
508 - 510 Selective self-test pending time
This field is the time in minutes from power-on to the resumption of the off-line testing if the
pending bit is set. At the expiration of this time, sets the active bit to one, and resumes the off-line
scan that had begun before power-down.
511
Data structure checksum
This field is the two's complement of the sum of the first 511 bytes in the sector .
