K6610007
Rev.5
02.14.’03
- 69 -
(4) SMART Self-test Log
[Log Sector Address = 06h]
The last twenty-first results of SMART short self-test routine, SMART extended self-test routine and SMART
selective self-test routine are gathered in SMART self-test log. Following Table defines the 512 bytes that
make up the SMART self-test log.
Byte Description
0 - 1
Self-test log data structure revision number
The value of Self-test log data structure revision number is 0001h
2 - 25
1
st
descriptor entry
26 - 49
2
nd
descriptor entry
: :
482 - 505
21
st
descriptor entry
506 - 507
Vendor Specific
508
Self Test index
The self-test index points to the most recent entry. Initially, when the log is empty,
the index is set to zero. It is set to one when the first entry is made, two for the
second entry, etc., until the 22nd entry, when the index is reset to one.
509 - 510
Reserved
511
Data structure checksum
Self-test log descriptor entry
This log is viewed as a circular buffer. The first entry begins at byte 2, the second entry begins at byte 26,
and so on until the twenty-second entry, that replaces the first entry. Then, the twenty-third entry replaces
the second entry, and so on. If fewer than 21 self-tests have been performed by the device, the unused
descriptor entries are filled with zeros. The content of the self-test descriptor entry is shown in following table.
Table 6.16 Self-test log descriptor entry
Byte Description
n
Content of the Sector Number
This contains the content of the Sector Number register when the Nth self-test
subcommand was issued.
n+1
Content of the self-test execution status byte
This contains the result of self-test routine when the Nth self-test was completed.
n+2 ~ n+3 Life timestamp
This contains the Power-on lifetime of the device in hours when the Nth self-test
subcommand was completed.
n+4
Content of the self-test failure checkpoint byte (Vendor specific)
This contains additional information about the self-test routine that failed.
n+5 ~ n+8 Falling LBA
The failing LBA is the LBA of the uncorrectable sector that caused the test to fail. If the
device encountered more than one uncorrectable sector during the test, this field shall
indicate the LBA of the first uncorrectable sector encountered. If the test passed or the test
failed for some reason other than an uncorrectable sector, the value of this field is
undefined.
n+9 ~ n+23 Vendor Specific
