Electrical Characteristics
MC9S12XHY-Family Reference Manual, Rev. 1.01
720
Freescale Semiconductor
A.1.6
ESD Protection and Latch-up Immunity
All ESD testing is in conformity with CDF-AEC-Q100 stress test qualification for automotive grade
integrated circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM) and the Charge Device Model.
A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
Table A-1. Absolute Maximum Ratings
1
1
Beyond absolute maximum ratings device might be damaged.
Num
Rating
Symbol
Min
Max
Unit
1
I/O, regulator and analog supply voltage
V
DD35
–0.3
6.0
V
2
Digital logic supply voltage
2
2
The device contains an internal voltage regulator to generate the logic and PLL supply out of the I/O supply. The absolute
maximum ratings apply when the device is powered from an external source.
V
DD
–0.3
2.16
V
3
PLL supply voltage
2
V
DDPLL
–0.3
2.16
V
4
NVM supply voltage
2
V
DDF
–0.3
3.6
V
5
Voltage difference V
DDX
to V
DDA
∆
VDDX
-0.3
0.3
V
6
Voltage difference V
SSX
to V
SSA
∆
VSSX
–0.3
0.3
V
5
Voltage difference V
DDM1,2
to V
DDA
∆
VDDMA
–0.3
0.3
V
6
Voltage difference V
SSM1,2
to V
SSA
∆
VSSMA
–0.3
0.3
V
7
Digital I/O input voltage
V
IN
–0.3
6.0
V
8
Analog reference
V
RH,
V
RL
–0.3
6.0
V
9
EXTAL, XTAL
V
ILV
–0.3
2.16
V
11
Instantaneous maximum current
Single pin limit for all digital I/O pins
3
3
All digital I/O pins are internally clamped to V
SSX
and V
DDX
, or V
SSA
and V
DDA
.
I
D
–25
+25
mA
12
Instantaneous maximum current
Single pin limit for EXTAL, XTAL
4
4
Those pins are internally clamped to V
SSPLL
and V
DDPLL
.
I
DL
–25
+25
mA
14
Maximum current
Single pin limit for power supply pins
I
DV
–100
+100
mA
15
Storage temperature range
Tstg
–65
155
°
C
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