SECTION 5: TECHNICAL SPECIFCIATIONS
Entire Contents Copyright
2014 by Adaptive Power Systems, Inc. (APS) • All Rights Reserved • No reproduction without written authorization from APS.
42L Series Modular DC Load Operation Manual
Page 34 of 88
5.7
Analog Programming Input
The 42L Series does
not
support the analog programming inputs located on the rear panel of
the 44M0X mainframe as there are more load channels than analog inputs.
Figure 5-2: Location and Pin-out of Analog Programming Input Connector
5.8
Load Current Slew Rate
The programmable current slew rate of the DC load allows control over the rate of change in
current any time a change in current occurs. This controls the load current slew rate during
load current level changes, power supply turn ON/OFF events or when turning the LOAD
ON, and OFF. The 42L Series loads provide controlled current slewing under all of these
conditions. The rise and fall current slew rate can each be set independently.
Rise and fall slew rates can be independently programmed. This allows an independent
controlled transition from Low load current level to High load current level ( Rise current
slew rate ) or from High load current level to Low load current level( Fall current slew rate )
to minimize induced voltage drops on the wiring inductance, or to control induced voltage
transients on the device under test ( power supply transient response testing ).
See under “DYNAMIC OPERATION, Slew Rate” in the specification section on page 23 for
slew rate programming range by model.
This controllable load current slew rate feature also can eliminate the overload current
phenomenon and emulate the actual load current slew rate at turn ON of the power supply
under test. Figure 5-9 shows the load current slew rate is according to the power supply's
output voltage, load level setting and Load ON/OFF switch.
The ability to apply all these dynamic current characteristics at the same time using the
Constant Current mode of the 42L Series load greatly speeds up power supply testing tasks.
This can significantly improve the test quality, thoroughness and efficiency.
