3.5.3
Selecting the internal fault test
The internal fault test can be activated from the IED test view.
1. Select IED test from the main menu structure to activate the IED test view.
Figure 6: IED test view
2. Enable parameter editing by selecting Enable Edit.
3. Select the test mode to be activated by changing the New Value field selection.
4. Select Write to device to save changes into the IED's memory.
The selected test mode is now activated.
3.5.4
Selecting the IED blocked or IED test and blocked mode
The IED blocked mode and the IED test and blocked mode can be activated from
the IED test view. The test mode can be used for simulated testing of functions and
outputs without providing current inputs. The IED blocked mode can be used to
block the physical outputs to the process.
1. Select IED test from the main menu structure to activate the IED test view.
Figure 7: IED test view
2. Enable parameter editing by selecting Enable Edit.
3. Select the test mode to be activated by changing the New Value field selection.
4. Select Write to device to save changes into the IED's memory.
The selected test mode is now activated.
Commissioning
1MRS758850 D
26
SSC600
Operation Manual