ZEISS
Glossary
Glossary
Backscattered electrons
High-energy electrons that originate in
the primary electron beam and which are
reflected or backscattered out of the
specimen.
BSE
Backscattered Electron
CC
Charge Compensator, Charge Compensa-
tion
Charging
Effect of the electron beam building up
an electric charge within a nonconduct-
ing specimen. Effects: poor imaging,
physical movement of the specimen.
EHT
Extra High Tension
EIGA
European Industrial Gases Association
FEG
Field Emission Gun
FESEM
Field Emission Scanning Electron Micro-
scope
Focal CC
Option that allows you to minimize
charging effects by emitting a local flow
of gaseous nitrogen onto the region of
interest on the specimen surface.
IGC
Industrial Gases Council
MSDS
Material Safety Data Sheet
N₂
Nitrogen
Primary electron beam
Narrowly bundled beam of accelerated
electrons that hit the specimen surface.
ROI
Region of interest
SE
Secondary Electron
Secondary electrons
Low energy electrons that are liberated
from the specimen surface when the
specimen is hit by the primary electron
beam. Secondary electrons are generated
by inelastic scattering.
SEM
Scanning Electron Microscope
Serial block-face imaging
Method to generate high resolution
three-dimensional images from a speci-
men embedded in a resin block. The face
of the block is automatically imaged ev-
ery time an ultramicrotome has removed
the surface layer and the block is raised
again to the focal plane.
Ultramicrotome
Device to cut a specimen into ultra-thin
sections.
User
Person examining a sample under the mi-
croscope.
ZEISS
ZEISS is an internationally leading tech-
nology enterprise operating in the fields
of optics and optoelectronics. Further in-
formation about ZEISS can be found at
www.zeiss.com.
ZEISS Sales & Service Partner
The Sales & Service Partner is generally in
the field for customer support in a re-
gional area and / or a clearly defined cus-
tomer group.
ZEISS service representative
Specially trained service expert, either
ZEISS staff or authorized service partner
of ZEISS.
Instruction Manual ZEISS Focal CC | en-US | Rev. 2 | 349561-8021-000
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