ZEISS
6 Operation | 6.5 Finding Appropriate Detector Settings
STEM Control
STEM imaging mode
Output signal
Off
-
BF
S1
ADF
S2 + S3 + S4 + S5
ODF 0°
S2 - S3 + S4 - S5
ODF 90°
S3 - S2 - S4 + S5
HAADF
S6
ADF + HAADF
S2 + S3 + S4 + S5 + S6
DF 0°
S2
DF 90°
S3
DF 180°
S4
DF 270°
S5
User defined name
Custom combination of
segments
Active segments with +/-
signs
Custom combination of
segments.
"+" on, "-" inverted
1. In the Crossbeam SEM Control panel, select the Imaging tab.
2. For displaying several channels of a aSTEM/STEM detector simultaneously, from the
Menu
Bar
, select
Scanning > Quad Mode
.
à
The
Image Area
is divided into 4 zones.
To select a detector for a zone, click in the zone.
An anchor symbol is displayed in the selected zone.
3. From the
Signal A
drop-down list, select a STEM detector, e.g.
aSTEM1
.
4. In the
Panel Configuration Bar
, double-click
STEM Control
.
To open the
Panel Configuration Bar
, from the
Menu Bar
, select
Tools > Goto Panel
.
à
The
STEM Control
dialog is displayed.
In the upper section, the
STEM Control
dialog displays the status of the diode seg-
ments.
The status is either on (white), inverted (black), or off (gray).
5. Either select a STEM imaging mode from the
STEM Seg. Mode
/
STEM 6 Seg. Mode
drop-
down list or click a custom selection of diode segments to toggle its status between on, in-
verted, and off.
6. Set the
Gain range
.
Select between
Low
,
Medium
,
High
, or
Very High
.
7. For displaying several channels of a aSTEM/STEM detector simultaneously, repeat steps 3 to
6 for the other display zones.
Instruction Manual ZEISS Crossbeam 350 | en-US | Rev. 3 | 349500-8111-000
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