OQ=çÑ=PO
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15 Click on
Start
.
The target area will now be exposed to the
scanning argon beam for the selected time.
The remaining polishing time is displayed
in
Time Left
.
While polishing the TEM lamella, you can monitor
the progress in the SEM image:
a
Click on
Grab Sem Frame
.
Alternatively, select
FIB Mode Argon +
SEM
in the FIB mode selection
.
Summary of Contents for Argon Ion Beam System
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