98
Reference
Decay
: The amount of pressure change a product can sustain
during a test period before going out of an established
tolerance. This applies to both pressure and vacuum decay
testing.
Electronic Regulator
: An optional device that automatically
adjusts the test pressure to a preset value. Multiple test
programs with multiple test pressures may be linked
together if this option is installed. It also provides a way to
avoid having the operator manually adjust the pressure for
different test pressures. (Also see “Electronic
Programmable Regulator” on page 111.
Evacuate Time
: The time duration to apply a vacuum to the
test product in tests such as a decay test (vacuum).
Event
: The instant pressure drops below the event value
during a burst or creep test. Sprint iQ monitors pressure
during a burst test or creep test and holds the maximum
pressure value measured before the event (pressure drop)
occurred.
Factory-Configured Programs
: Uson ships Sprint iQ with a
few programs already set up out of the 100 positions
available to hold test programs. These programs can be
retained, modified, or replaced as desired.
Fail Ligh
t: The fail light for a channel turns on whenever a
test exceeds established parameters. The light is
extinguished when the next test starts.
Fill Time
: The time duration to apply test pressure to the
product in tests such as a decay test (pressure).
Firmware
: The set of instructions stored in programmable
read-only memory (PROM) that tell Sprint how to
operate. Firmware cannot be altered by the customer.
