AM335x
(ZCZ Package)
RTC_XTALIN
RTC_XTALOUT
N/C
LVCMOS
Digital
Clock
Source
VSS_RTC
VDDS_RTC
AM335x
(ZCE Package)
RTC_XTALIN
RTC_XTALOUT
N/C
LVCMOS
Digital
Clock
Source
VDDS_RTC
AM3359, AM3358, AM3357, AM3356, AM3354, AM3352
SPRS717H – OCTOBER 2011 – REVISED MAY 2015
6.2.2.4
OSC1 LVCMOS Digital Clock Source
shows the recommended oscillator connections when OSC1 of the ZCE package is connected
to an LVCMOS square-wave digital clock source and
shows the recommended oscillator
connections when OSC1 of the ZCZ package is connected to an LVCMOS square-wave digital clock
source. The LVCMOS clock source is connected to the RTC_XTALIN terminal. The ground for the
LVCMOS clock source and VSS_RTC of the ZCZ package should be connected directly to the nearest
PCB digital ground (VSS). In this mode of operation, the RTC_XTALOUT terminal should not be used to
source any external components. The printed circuit board design should provide a mechanism to
disconnect the RTC_XTALOUT terminal from any external components or signal traces that may couple
noise into OSC1 via the RTC_XTALOUT terminal.
The RTC_XTALIN terminal has a 10- to 40-k
Ω
internal pullup resistor which is enabled when OSC1 is
disabled. This internal resistor prevents the RTC_XTALIN terminal from floating to an invalid logic level
which may increase leakage current through the oscillator input buffer.
Figure 6-15. OSC1 (ZCE Package) LVCMOS Circuit Schematic
Figure 6-16. OSC1 (ZCZ Package) LVCMOS Circuit Schematic
Table 6-7. OSC1 LVCMOS Reference Clock Requirements
NAME
DESCRIPTION
MIN
TYP
MAX
UNIT
ƒ
(RTC_XTALIN)
Frequency, LVCMOS reference clock
32.768
kHz
Frequency, LVCMOS reference clock
Maximum RTC error =
–20
20
ppm
stability and tolerance
(1)
10.512 minutes/year
Maximum RTC error = 26.28
–50
50
ppm
minutes/year
t
dc(RTC_XTALIN)
Duty cycle, LVCMOS reference clock period
45%
55%
t
jpp(RTC_XTALIN)
Jitter peak-to-peak, LVCMOS reference clock period
–1%
1%
t
R(RTC_XTALIN)
Time, LVCMOS reference clock rise
5
ns
t
F(RTC_XTALIN)
Time, LVCMOS reference clock fall
5
ns
(1)
Initial accuracy, temperature drift, and aging effects should be combined when evaluating a reference clock for this requirement.
Copyright © 2011–2015, Texas Instruments Incorporated
Power and Clocking
113
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