Specifications
30
GTS1063 and GTS1250 GBIC Test Systems Instruction Manual
Table 6: Tx Data and Tx Clock Out Specifications (cont.)
Specification
Description
Tx SYNC Out pulse width and repetition
rate (typical)
GTS1250 Repetition rate:
Pulse width
D21.5, K28.7:
62.5 MHz (10 in 20 UI)
8 ns
"
1 ns
K28.5:
31.25 MHz (20 in 40 UI)
16 ns
"
1 ns
PRBS7:
984.251 kHz (10 in 1270 UI)
8 ns
"
1 ns
LONG:
81.3802 kHz (160 in 15360 UI)
128 ns
"
1 ns
SHORT:
336.02 kHz (160 in 3720 UI)
128 ns
"
1 ns
GTS1063 Repetition rate:
Pulse width
D21.5, K28.7:
51.125 MHz (10 in 20 UI)
9.4 ns
"
1 ns
K28.5:
26.5625 MHz (20 in 40 UI)
18.8 ns
"
1 ns
PRBS7:
836.614 kHz (10 in 1270 UI)
9.4 ns
"
1 ns
CRPAT:
466.008 kHz (2640 in 2280 UI)
263.353 ns
"
1 ns
CJTPAT:
402.462 kHz (280 in 2640 UI)
263.353 ns
"
1 ns
Test Method: Split Tx SYNC Out pulse through an electrical splitter: use half to trigger an
1180X oscilloscope and measure the other half on the SD-22.
External clock sensitivity
u
300 mV
pp
and
t
1.4 V
pp
, AC coupled
n
Data-to-Clock random jitter
Tx DATA, DATA:
t
4 ps RMS;
t
35 ps
p-p
.
t
2 ps RMS;
t
25 ps
p-p
typical
Data-to-SYNC Out random jitter (typical)
Tx DATA, DATA:
t
4 ps RMS;
t
42 ps
p-p
for D21.5, K28.7 patterns only.
Test Method: To measure, set the DATA pattern to 1010101010 repeating (125 MHz
[GTS1250] or 531.25 MHz [GTS1063] square wave: D21.5 pattern). Trigger a Tektronix
SD-22 sampler (12.5 GHz is used) and an 1180X oscilloscope by the Sync Out. Measure
the rising edge of the sampled DATA that occurs in the first 30 ns after the trigger event.
Make histogram measurements at the 50% crossing level, capturing 100 waveforms and
then stop further acquisitions.
n
Data-to-SYNC Out (K28.5 pattern)
deterministic jitter
Tx DATA, DATA:
t
40 ps
p-p
DJ; (0.05 UI for GTS1250; 0.0425 UI for GTS1063).
t
20 ps
p-p
DJ; (0.025 UI for GTS1250; 0.021 UI for GTS1063), typical
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