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33

Delayline Detector DLD4040  Manual

Figure 14: Typical gain degradation of MCPs as function of the extracted output charge.

After an initial burn-in period, in which the detector gain changes as a result of electron induced chemical 

allocation together with degassing residual gas molecules from the inside of the channels, the MCP 

performance is very stable over a large amount of extracted output charge. The MCP gain is also a function 

of the detectors operation voltage. Therefore gain degradation can always be compensated by increasing 

the detector voltage. 

Detector delivery will still happen with the MCPs operating within the burn-in period, although the detector 

has been operated for some longer time with highest count rates during the test phase, Therefore gain 

degradation will be still significant in the first year of operation (or even longer, depending on applied count 

rates) and becomes obvious by a decline of the detector performance. Therefore it will become necessary 

to increase the operation voltage from time to time. Voltage increase should always be made in small steps 

(typically 50 V). There is a recommended maximum operation voltage, to which the detector voltage can 

be increased to compensate gain degradation over time. This voltage is given in the specification sheet of 

each detector.  

A typical behavior of the detector voltage increase over time to compensate gain degradation is given 

schematically in 

Figure 15

.

DLD4040 R2.55 & R3.54 Manual | Surface Concept GmbH

Summary of Contents for DLD4040

Page 1: ...Delayline Detector DLD4040 Manual Delayline Detector DLD4040 Release 2 55 3 54 Manual...

Page 2: ...ny phone 49 6131 62716 0 fax 49 6131 62716 29 email info surface concept de web www surface concept de All rights reserved No part of this manual may be reproduced without the prior permission of Surf...

Page 3: ...edure 13 4 1 2 Dark Count Rate Measurement 15 4 1 3 Standard DLD Measurement 16 4 2 Standard Operation Procedure 16 4 2 1 Operation with MCP Front Side terminated to GROUND 16 4 2 2 Operation of the D...

Page 4: ...3 4 2 29 7 1 1 Positions of the Discriminator Threshold Regulators 30 8 Micro Channel Plate MCP 31 8 1 Specifications 31 8 2 Storage 31 8 3 Handling 31 8 4 Operation 32 8 5 MCP Lifetime and Operation...

Page 5: ...of the DLD describes the operation of the DLD The final chapters contain amongst others technical details about the microchannel plates and the delayline detector in general 2 2 Safety Instructions Th...

Page 6: ...lectronics The 3D x y t detection bases on the measurement of time differences and time sums of signals with a high temporal resolution in one device The count rate can reach several MHz in the common...

Page 7: ...ting the Delayline Detector The detector is transported under vacuum Proceed as follows to install it into your vacuum chamber Vent the transport container carefully and slowly use N2 for venting if p...

Page 8: ...hould not be exceeded The transport housing should be evacuated regularly with a period of at least one month in case that the transport housing must be used for a longer storage time Note 3 2 2 Detec...

Page 9: ...ne detector R2 55 including its readout package is shown in Figure 2a that of the delayline detector R3 54 in Figure 2b Figure 2a Connection scheme of the delayline detector R2 55 and readout package...

Page 10: ...ormation In cases that no reference voltage is applied to the MCP front the termination plug must be used to ground the MCP front Otherwise the MCP stack is not functioning as the reference potential...

Page 11: ...e PC Do not use PC front panel USB connectors they are often restricted in performance To perform time measurements with respect to an external clock provide start pulses to the start input of the TDC...

Page 12: ...12 DLD4040 R2 55 R3 54 Manual Surface Concept GmbH T h i s s i d e h a s b e e n l e f t b l a n k o n p u r p o s e...

Page 13: ...inish the complete cabling as described in Chapter 3 and as described in the manual of the HV Power Supply Turn on the TDC Start your end user software e g GUI software and within this software the ra...

Page 14: ...parking If sparking occurs turn down the high voltage immediately and wait some time up to 5 min Start the Start Up procedure again with an increased ramp time Turn off the high voltage completely sto...

Page 15: ...fic DLD image can differ in size shape and segmentation Example Assume the following operation voltage for MCP B 1800V and U_DLD 400V MCP F is terminated to GROUND First ramp U_DLD to 400V then a ramp...

Page 16: ...light or X rays that might hit the detector Increase the detector voltage for MCP B to the specified operation voltage stepwise within a couple of minutes The starting operation voltage is specified i...

Page 17: ...plete cabling as described in Chapter 3 and as described in the manual of the HV Power Supply Connect the external reference voltage to the MCP F connector DO NOT APPLY ANY HIGH VOLTAGE yet Turn on th...

Page 18: ...n in Figure 5 Watch the vacuum pressure while increasing the high voltage turn the voltages back if an unusual increase is observed in the pressure indicator for high voltage sparking High voltage spa...

Page 19: ...oltage MCP F The maximum reference voltage for MCP F is also given in the specification sheet The Surface Concept HV Power Supply is a floating HV device The reference voltage must not explicitly be a...

Page 20: ...Do not operate the detector before the temperature has returned to ambient conditions After a bake out the detector needs at least one day to cool down If channel plates are operated at higher temper...

Page 21: ...where it induces electrical pulses into the delayline by capacitive coupling The pulses are traveling to the both ends of the meander within a time determined by the hitting position Each hit position...

Page 22: ...ent and t offset is a device related constant which depends on cable lengths electronics propagation times experimental setup etc Therefore it is possible to completely determine position and time of...

Page 23: ...erloads and again pulse detection is not possible Saturation effects of the MCPs limit the amount of electrons provided by single pulses An intensity increase of the electron source leads to an increa...

Page 24: ...on MCP degradation and detector working voltages see Chapter 8 Figure 8 Example of an overvoltage on the MCPs left and an under voltage at high count rates right 5 5 MCP Outgasing during Operation It...

Page 25: ...ose to ground potential in respect to the high voltage of the MCPs A pulse coupling layer is used to isolate the meander from the high voltage of the MCP stack as well as to couple pulses from the ele...

Page 26: ...gnal transfer see Figure 10 The flange for the signal transfer also holds an orientation pin for correct orientation of the ACU The allocation of the four signal channels X1 X2 Y1 and Y2 on the SMB fl...

Page 27: ...ematic The resistance between MCP B and MCP F resistance of MCP stack should be in the range of 8 30 M the exact value is given in the specification sheet of your detector while the resistance between...

Page 28: ...28 DLD4040 R2 55 R3 54 Manual Surface Concept GmbH T h i s s i d e h a s b e e n l e f t b l a n k o n p u r p o s e...

Page 29: ...ends on the layout of the detector as well as the pulse processing electronics The ACU 3 4 2 contains the amplifiers pulse shapers and constant fraction discriminators for signal processing Figure 12...

Page 30: ...ts best performance to the starting operation voltage of the detector when delivered A new adjustment should not be needed The starting operation voltage is given in the specification sheet The operat...

Page 31: ...there is no solid glass border Use clean degassed tools fabricated from stainless steel Teflon or other ultra high vacuum compatible materials Handling MCPs should be limited to trained experienced p...

Page 32: ...eedback or to an electrical breakdown Apply voltages as defined in Chapter 4 If fluctuations appear damage or contamination should be suspected and the voltage should be turned off The assembly should...

Page 33: ...eriod althoughthedetector has been operated for some longer time with highest count rates during the test phase Therefore gain degradationwillbestillsignificantinthefirstyearofoperation orevenlonger d...

Page 34: ...be increased even above the recommended maximum operation voltage A safe and reliable operation will still be possible as long as there is no increase in the dark count rate and or no appearance of h...

Page 35: ...amount of extracted output charges after the burn in period The main reason for an often much shorter operation time of the MCPs is an inhomogeneous irradiation of the MCPs This is connected to a loc...

Page 36: ...rease for the smaller count rate should now be much smaller The detector will be delivered already pre conditioned Unfortunately the degas procedure must be started anew to a certain extend after each...

Page 37: ...r DLD4040 Manual 9 Troubleshooting Consult the Hints_and_TroubleShootingDLDs Manual part of the detector delivery in case of any problems prior to contacting your provider DLD4040 R2 55 R3 54 Manual S...

Page 38: ...38 DLD4040 R2 55 R3 54 Manual Surface Concept GmbH T h i s s i d e h a s b e e n l e f t b l a n k o n p u r p o s e...

Page 39: ...peration Delayline Detector General CF160 CF100 40mm round see specification sheet see specification sheet typ 400V connected to MCP F potential not available 1x 4 fold SMB Feedthrough on CF40 Flange...

Page 40: ...40 DLD4040 R2 55 R3 54 Manual Surface Concept GmbH T h i s s i d e h a s b e e n l e f t b l a n k o n p u r p o s e...

Page 41: ...ayline operation 21 Figure 7 Example of a partial overload left and a heavy global overload right 23 Figure 8 Example of an over voltage on the MCPs left and an under voltage at high count rates right...

Page 42: ...is in conformity with the following standards or other normative documents where relevant EN 61000 6 2 2005 AC 2005 Electromagnetic compatibility EMC Generic standards Immunity for industrial environ...

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