Sun Microsystems Enterprise 250, Owner'S Manual

Page: 279 / 369

TABLE 12–3
Test Name Description Special Considerations
SUNW,envctrltwo
@14,60000
Verifies that the fans are
operational. Checks that the
temperature in the enclosure and at
the CPUs does not exceed the
maximum allowable range. Also
tests the disk and front panel LEDs.
ebus@1
Tests the on-board ASIC that
interfaces the following devices
with the PCI bus: parallel port,
serial port, keyboard, mouse,
diskette drive, NVRAM, and the
environmental monitoring and
control system.
ecpp
@14,3043bc
Tests parallel port I/O logic,
including internal and external
loopback tests. To run external loopback tests,
you must have a special passive
loopback connector attached to the
parallel port. The variable
diag-targets
must be set to
loopback
,
device&loopback
, or
device&loopback,3
.
The Sun part number for the
parallel port loopback connector is
501-2965-01.
eeprom@14,0
Tests the NVRAM functionality.
fdthree
@14,3023f0
Tests diskette drive control logic
and the operation of the drive. The
test does not differentiate among a
drive, media, or main logic board
error; if any of these fail, it reports
the diskette drive as the FRU. A formatted diskette must be
inserted into the drive.
network@1,1
Tests the on-board Ethernet logic,
including internal and external
loopback tests. To run external loopback tests on
the TPE port, you must have a TPE
loopback connector attached to the
TPE port. The variable
diag-targets
must be set to
loopback
,
device&loopback
, or
device&loopback,3
.
The Sun part number for the TPE
loopback connector is 501-4689-01.
Diagnostics and Troubleshooting
245