Minimum
Typical
Maximum
Load capacity
2.2 µF
Load inductance
2.2 H
Test pulse data
4)
Test pulse width
150 µs
300 µs
Test pulse rate
3 s
–1
5 s
–1
10 s
–1
Discrepancy time (time offset
between switching of OSSD2 and
OSSD1)
1 ms
Inputs
Input voltage HIGH (active)
2)
11 V
24 V
30 V
Input current HIGH
6 mA
10 mA
20 mA
Input voltage LOW (deactivated)
2)
-3 V
0 V
5 V
Input current LOW
-2.5 mA
0 mA
0.5 mA
Reset pushbutton input (RES)
Control switch actuation time
50 ms
60 s
C1 muting release input
Input filter
50 ms
Override input
Control switch actuation time
50 ms
60 s
Muting signal inputs
Input filter
50 ms
Application diagnostic output (ADO)
PNP semiconductor, short-circuit protected
1)
Output voltage HIGH (active)
U
v
– 3 V
Output voltage LOW (deactivated)
High resistance
Output current HIGH (active)
100 mA
Permissible cable resistance
5)
Supply cable
2 Ω
Cable between OSSD and load
2.5 Ω
All additional wires at the system
connection and the reset/override
pushbutton connection
2.5 Ω
1)
Applies to the voltage range between -30 V and +30 V.
2)
According to IEC 61131-2.
3)
The specified values are the switching voltage supplied by the device. If higher voltages are impressed
externally, the maximum value of 2.0 V can be exceeded.
4)
When active, the outputs are tested cyclically (brief LOW). When selecting the downstream controllers,
make sure that the test pulses do not result in deactivation when using the above parameters.
5)
Limit the cable length to the specified values to ensure that the protective device functions correctly, par‐
ticularly that a cross-circuit between the outputs is safely detected. (Also observe IEC 60204-1.) The
specified values apply to the total resistance of each wire including contact and connector resistances.
TECHNICAL DATA
13
8024802/2020-07-17 | SICK
O P E R A T I N G I N S T R U C T I O N S | deTem4 LT Muting A/P
89
Subject to change without notice