
Analog Bandwidth Test Record Form
Model
Limit
CH1
CH2
CH3
CH4
DS70304 (3 GHz)
-3 dB
DS70504 (5 GHz)
-3 dB
Timebase Accuracy Test Record Form
Timebase Accuracy
[1]
Limit: ±(0.5 ppm + 1 ppm
[2]
/year × Number of Years that
the Instrument Has Been Used
[3]
)
Channel
Test Result ΔT
Calculation Result
[4]
Limit
Pass/Fail
CH1
NOTE
[1]: Typical.
[2]: Clock Drift.
[3]: For the number of years that the instrument has been used, please calculate according to
the date in the verification certificate provided when the instrument leaves factory.
[4]: Calculation Result = Test Result ΔT/1 ms.
Random Noise Test Record Form
Vertical Scale
Bandwidth
Test Result
Max.
DS70304
DS70504
50 Ω
1 mV/div
20 MHz
400 μV
500 μV
2 mV/div
20 MHz
400 μV
500 μV
5 mV/div
Full BW
600 μV
800 μV
10 mV/div
Full BW
680 μV
900 μV
20 mV/div
Full BW
1.40 mV
2.00 mV
50 mV/div
Full BW
3.50 mV
5.00 mV
100 mV/div
Full BW
5.60 mV
8.00 mV
200 mV/div
Full BW
15.0 mV
20.0 mV
500 mV/div
Full BW
28.0 mV
40.0 mV
1 V/div
Full BW
35.0 mV
60.0 mV
1 MΩ, all models
1 mV/div
20 MHz
500 μV
2 mV/div
20 MHz
500 μV
5 mV/div
Full BW
600 μV
10 mV/div
Full BW
900 μV
20 mV/div
Full BW
2.00 mV
50 mV/div
Full BW
4.00 mV
Appendix: Test Record Form
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DS70000 Performance Verification
35