CHAPTER 6 JTAG BOUNDARY SCAN
PRELIMINARY
NEC confidential and Proprietary
315
Figure 6-5. Operation of Test Logic (Data Scan)
Note
TDR (Test Data Register): Boundary scan register and bypass register
Remark
: Don't care or undefined
Ru
n
-
Te
st / Id
le
Selec
t
-D
R
-
Sc
an
Ca
p
t
u
re-D
R
E
x
it
1
-
DR
E
x
it
2
-
DR
E
x
it
1
-
DR
U
p
dat
e-D
R
Selec
t
-D
R
-
Sc
an
Ru
n
-
Te
st/Id
le
Te
st-
L
o
g
ic
-R
es
et
Selec
t
-I
R
-
Sc
an
S
h
if
t-
DR
Paus
e-D
R
S
h
if
t-
DR
Active
B y p a s s
N e w d a t a
O l d d a t a
I n a c t i v e
A c t i v e
I n a c t i v
I n a c t i v e
I n s t r u c t i o n
T e s t d a t a r e g i s t e
r
JCK pin signal
JMS pin signal
Controller state
JDI pin signal
Input data to IR
IR shift register
Parallel output of IR
Input data to TDR
TDR shift register
Parallel output of TDR
Selected register
JDO enable signal
JDO pin signal
Summary of Contents for NEASCOT-P65
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