Device description
Leuze electronic
ODS 9
20
Measurement value processing and filtering is set according to the given requirements and the application
via the display or using the
Sensor Studio
configuration software.
By changing the measurement value processing or filtering, the response time and accuracy can be in-
creased.
NOTICE
A higher response time presupposes the possibility of measuring an object for a longer period.
Measurement value processing
Processing settings > Measure mode > Standard/Precision/Ambient light
Tab. 3.3:
Measurement value processing
Accuracy
Measurement
time / reload
Ambient light
Varying diffuse
reflection
Standard
+
+
+
+
Precision
+ +
- -
+
+
Ambient light
+
- -
+ +
0
Filter
Filter settings > Filter type > Averaging/outlier suppression
A floating average value is calculated over the number of set measurement values.
The measurement value noise decreases, i.e., measurement value fluctuations become smaller.
If the measurement value changes erratically, the output value moves linearly from the old measurement
value to the new measurement value over n measurements.
The higher the number of measurements is set, the higher the response time of the sensor. With dynamic
applications, averaging should be set to a very low number of measurement values or switched off alto-
gether.
The time of measurement value updating is not affected by the filtering.
Outlier suppression
Filter settings > Degree of suppression > Coarse/Medium/Strong
Measurement results with excessively high or low measurement values (referred to as "outliers" or
"spikes") are suppressed or rejected according to the set filter depth.
• The user sets the number of measurements via the display or using the configuration software
Sen-
sor Studio
.
• The sensor performs the set number of measurements on the object, e.g. 100 measurements.
Due to physical reasons, the measurement results are not all the same. The measurement values have a
scatter which corresponds to a normal distribution comprising a large number of similar measurement val-
ues and a small number of excessively high or low measurement values (outliers, spikes).
