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4.3 Fault Finding Using MULTIMETER
Parts defects can be found for DIODE TRANSISTOR IC, using MULTI TEST including Forward/Reverse
direction Multi Test. Of course, in case resistance of several ohms and COIL are connected in parallel circuit,
the lock out circuit parallel connected to part must be severed.
1. DIODE
Forward Direction
Reverse Direction
Between Anode and Cathode
Hundreds of ohms
Infinity
2. Transistor
● For NPN(KTN2222AS,
…
)
C (COLLECTOR)
B (BASE)
E (EMITTER)
Forward Direction
Reverse Direction
Between B and E
Hundreds of ohms
Infinity
Between B and C
Hundreds of ohms
Infinity
Between E and C
Infinity
Infinity
● For PIN(KTN2907AS,
…
)
C (COLLECTOR)
B (BASE)
E (EMITTER)
Forward Direction
Reverse Direction
Between B and E
Hundreds of ohms
Infinity
Between B and C
Hundreds of ohms
Infinity
Between E and C
Infinity
Infinity
Anode
Red
Cathode
Black
Hundreds of ohms
Anode
Red
Cathode
Black
Infinity
E B C
E B C