Appendix B: Kelvin (4W) S530 system diagnostics
S530
Diagnostic Manual
Kelvin voltage communication test
The voltage communication test is essentially the same as the communications test for the SMU. An
instrument ID query is sent to the switch matrix and its response is read. This test is repeated three
times and if the correct response is read all three times and no timeouts occur, the communication
test will pass.
NOTE
The communications test is mandatory and cannot be skipped. If the communication test fails, the
other matrix diagnostic tests will not run.
Kelvin matrix diagnostic
To confirm that both the force and sense cards are functional, Kelvin-mode matrix diagnostics are
separated into force and sense parts.
NOTE
If the sense part of the continuity tests fail but the force part test passes, it is likely that problem is the
probe card. Usually it means that the sense and force terminals of the pin are not shorted together at
the probe card. If this is the case, then a blank probe card should be installed.
In the case of high-voltage system which uses the Keithley Model 7072-HV matrix cards, only rows G
and H are used during the CVU diagnostic. The CVU diagnostics for non-high-voltage systems will
use all of the matrix rows.
Matrix Communication Test
During the communication test, if the correct responses are returned from the instruments, the test
passes. Otherwise the test fails. Similar to the SMU communication test, if the matrix communication
test fails, the remaining matrix diagnostic tests will not run.
Kelvin basic short and continuity tests
Basic short test
The basic short test is executed by connecting two SMUs to different rows, forcing 1mA from the first
SMU, forcing 0V from the second SMU, and then measuring current using the second SMU. If the
measured current is higher than 1µA, Fail will display in the ACS GUI test log and in the diagnostic
reports located in the following directory:
C:\ACS\Projects\Diagnostic\Reports
3-6
S530-906-01 Rev. A / March 2011
