Appendix A: Non-Kelvin (2W) S530 system diagnostics
S530
Diagnostic Manual
Short test flow
The short test uses SMU1 and SMU2 using the Series 2600A instruments. Each pair of adjacent pins
will be tested with groups of rows. Each group of rows consists of row
n
and row
n
+1 (
n
= 1, 3,
5*)(see next Figure).
After connecting each set of pins and rows, execute the test by forcing 1mA from the first SMU and
forcing 0V from the second SMU. The current is then measured using the second SMU. If the
measured current is higher than 1
μ
A, Fail will display in the ACS GUI test log and in the diagnostic
report in the following default directory:
C:\ACS\Projects\Diagnostic\Reports
1. Every pair of adjacent pins will be tested. The last pin will be tested with the first pin to cover the
entire set of switch matrix pins. For example, pin 1 to pin 2, pin 2 to pin 3, pin 3 to pin 4, and pin 4
to pin 1.
2. When a Model 2410 SMU is in your system (high-voltage systems only), only row pair A and B
will be tested by the 2410. The remaining rows will be tested using the Series 2600A instruments.
Systems without a Model 2410 will test rows A through H using the Series 2600A instruments.
3. The connections of the rows and SMUs will reverse once in order to test the path in the opposite
direction. For example, first rows A and B and then rows B and A.
Figure 27: Short test
Short test connections
When two SMUs are working in 2W mode and the current pair is pin 2 and pin 3, and the current row
pair is C and D, the following Figure shows the connections:
2-8
S530-906-01 Rev. A / March 2011
