Either
the
in
ternal
logic,
the
TTL
T
rigger
Input,
or
the
HP-IB
Group
Execute
T
rigger
from
an
external
con
troller
can
initiate
a
measuremen
t
cycle.
When
con
trol
of
the
pulse
rep etition
p erio
d
and
dut
y
cycle
is
required,
the
HP
8510
can
use
the
trigger
input
to
sync
hronize
with
the
in
ternal
or
an
external
pulse
mo
dulator.
The
HP
8510
Stop
Sw
eep
output
can
b e
used
as
a
gating
signal
to
tell
when
the
analyzer
is
ready
for
the
next
measuremen
t.
The
measuremen
t
is
made
with
100
nanosecond
resolution
and
ab out
200
picosecond
uncertain
t
y
with
resp ect
to
the
in
ternally-
or
externally-generated
measuremen
t
trigger.
T
est
Set
Signal
Flo
w
Figure
2-2
sho
ws
a
detailed
diagram
of
the
HP
85110-series
test
set
signal
separation,
signal
routing,
and
frequency
con
v
ersion.
This
is
a
fundamen
tally
mixed
test
set,
pro
viding
four
20
MHz
outputs
to
the
net
w
ork
analyzer.
Placemen
t
of
a
0
to
90
db
(10
dB/step)
attenuator
b efore
eac
h
mixer
pro
vides
con
trol
of
the
signal
lev
els
in
to
the
mixers
while
allo wing
op eration
at
high
POR
T
1
and
POR
T
2
signal
lev
els
necessary
in
man
y
pulsed-RF
applications.
The
test
set
has
rear
panel
access
links
to
allo w
in
tegration
of
additional
test
and
signal
conditioning
equipmen
t
in
the
low-loss
main
signal
paths
to
the
test
p orts.
If
y
our
device
exhibits
more
than
ab out
20
dB
of
gain,
or
higher
p ort
signal
lev
els
are
required,
refer
to
the
High
P
o
w
er
Measuremen
ts
c
hapter.
Hewlett-Pac
k
ard
harmonic
mixing
test
sets
are
designed
to
w
ork
with
the
normal
10
kHz
IF
and
detectors.
These
include
the
HP
8514,
8515,
and
8516
coaxial
test
sets;
and
the
HP
85104
millimeter
w
a
v
eguide
test
set.
This
HP
85110
fundamen
tal
mixing
test
set
is
designed
to
w
ork
with
the
wideband
IF
and
detectors.
There
are
applications
in
whic
h
the
HP
85110
can
b e
used
with
normal
IF
and
detectors.
The
HP
85104
millimeter
test
sets
can
b e
congured
to
op erate
with
the
wideband
IF
and
p erform
the
pulse
measuremen
t
functions
describ ed
here.
All
HP
coaxial
test
sets
can
b e
equipp ed
to
include
Option
001,
IF
Switching
for
Multiple
T
est
Sets,
so
a
system
can
b e
equipp ed
for
a
wide
range
of
applications
b
y
including
up
to
four
coaxial
test
sets
and
a
millimeter-wa
v
e
test
set.
System
Description
2-3
Summary of Contents for 8510
Page 5: ......
Page 12: ...Figure 1 1 HP 8510 Pulsed RF Network Analyzer System Introduction 1 3 ...
Page 13: ......
Page 17: ...Figure 2 2 HP 85110A S Parameter Test Set Signal Flow 2 4 System Description ...
Page 21: ......
Page 27: ...Figure 5 1 System Cable Connections 5 2 Operating the HP 8510 for Pulsed RF Measurements ...
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Page 72: ...Figure 11 1 Option 008 Domain Stimulus and System Menus Reference Data 11 5 ...
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