HP 8510, User Manual

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System Description
This c hapter con tains the follo wing information.
A description of the HP 8510 Pulsed-RF Net w ork Analyzer System.
A simplied blo c k diagram of the HP 8510 Pulsed-RF Net w ork Analyzer System.
A signal o w diagram of the HP 85110-series S-parameter T est Set.
Who Should Mak e Pulsed-RF Measurements?
Pulsed-RF stim ulus may b e required in cases where con tinuous application of the test signal
could destroy the device, suc h as when testing o ccurs prior to pac k aging, or where the device
m ust b e tested using a PRF and dut y cycle that accurately represen ts its nal application.
The HP 8510 pulsed-RF net w ork analyzer conguration adds sp ecialized hardw are and an
optimized rm w are feature set to make fully error-corrected S-parameter measuremen ts of
pulsed-RF resp onses. F or the rst time, the com bination of wideband IF and accurate timing
circuits pro vides precise sync hronization with the pulse, allo wing S-parameters to b e measured
at a precisely kno wn, rep eatable time during the pulse. This extends the HP 8510 applications
in to t w o ma jor areas: tests in whic h the stimulus signal to the device is pulsed, and tests of
devices whic h accept a CW input and pro duce a pulsed output.
The HP 8510 pulsed-RF net w ork analyzer system allo ws y ou to calibrate in the same
en vironmen t as y our measuremen t. F or example, if y ou are making a high p o w er, pulsed-RF
measuremen t, y ou can calibrate in the same high p o w er, pulsed-RF mo de. Calibration data is
taken only while the pulse is on. This t yp e of calibration may prev en t damage to calibration
standards that w ould b e damaged in high p o w er, CW calibrations.
The recommended conguration of the HP 85108 Pulsed-RF Net w ork Analyzer consists of the
follo wing items.
HP 8510B/C net w ork analyzer equipp ed with Option 008, Wideband IF, and HP 8510
rm w are revision B.05.11 or greater (for the HP 8510B), or revision C.06.54 or greater (for
HP 8510C).
HP 83622 syn thesized sw eep er with options 001, 003, 004, and 008.
HP 83624 syn thesized sw eep er with options 003, 004, and 008.
HP 85110-series pulsed-RF fundamen tally mixed S-parameter test set
Also, other external equipmen t suc h as p o w er ampliers, bias supplies and pulse generators
may b e included in the system.
System Description 2-1