HP 8510, User Manual

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4
Pulse Measurements Ov erview
This c hapter con tains information ab out ho w the HP 8510 pulsed-RF net w ork analyzer system
measures pulsed-RF S-parameters v ersus frequency and v ersus time.
The pulsed-RF conguration allo ws use of v ector net w ork analysis tec hniques for t w o t yp es of
measuremen ts:
Pulsed-RF S-P arameters v ersus F requency . The measuremen t is sync hronized with the
pulse so that the measuremen t result is the S-parameter at a sp ecic user-sp ecied p oint in
the pulse at eac h frequency of the sw eep
Pulse Prole. The system is tuned to a single frequency and the measuremen t is
sync hronized with the pulse so that the measuremen t result is the S-parameter as a function
of time during the pulse.
Pulsed-RF S-parameters v ersus Frequency
Pulsed-RF tests in the frequency domain are accomplished b y sync hronizing the measuremen t
pro cess with the pulse so that the measuremen t is made at a single, user-sp ecied time
during the pulse. A t eac h frequency , the sources are tuned, the RF is turned on, then the
measuremen t is made after a certain dela y . Figure 4-1 sho ws an example of this \frequency
domain p oint-in-pulse" measuremen t using the in ternal pulse output and the in ternal
measuremen t trigger. F or in ternal trigger mo de, eac h data p oint of the trace represen ts the
resp onse of the device to the pulsed stimulus at the same in terv al after the pulse is turned on.
F or external trigger mo de, eac h data p oint of the trace represen ts the resp onse of the device to
the pulsed stimulus after the falling edge of the externally-generated measuremen t trigger.
Pulse Measurements Ov erview 4-1