Technical data
Liquitrend QMW43
36
Hauser
Description
The device supports data storage. When the device is replaced, the configuration of the old
device can be written to the new device.
The
Device Access Locks.Data Storage Lock
parameter can be used to prevent the
parameters from being overwritten. The original configuration of the new device is
maintained.
If the "true" option is selected, the new device does not apply the data that are saved in the
master's data storage.
Options
false
true
17
Technical data
17.1 Input
Measured process variable
Electrical conductivity, dielectric constant (ε
r
) of the medium
Calculated process variable
Thickness of buildup
Measuring range
Conductivity
0 µS/cm to 100 mS/cm
Minimum permitted span: 3
000 µS/cm can be ordered; 1
000 µS/cm can be configured at
the device via the IO-Link interface
Thickness of buildup
0 to 10 mm
17.2 Output
Output signal
The following options can be selected in the Product Configurator, order code for "Output":
Preconfigured assignment of the outputs:
• Option B
• OU1: frequency (buildup)
• OU2: frequency (conductivity)
• Option C
• OU1: frequency (buildup)
• OU2: 4 to 20 mA (conductivity)
Select the HT option if the device is to be adjusted to non-conductive media and the
measuring range is to be preconfigured.
Variable assignment of the outputs with the conductivity and thickness of buildup
parameters:
• Option 7
• OU1: IO-Link
• OU2: 4 to 20 mA (off, conductivity or buildup depending on the order, select the HT
option)
• Option 8
• OU1: IO-Link
• OU2: frequency (off or conductivity depending on the order, select the HT option)
