84
CY4636 WirelessUSB™ LP Keyboard Mouse Reference Design Kit User Guide, Doc. # 001-70355 Rev. *A
Code Examples
This configuration value sets the debounce time for buttons that are pressed. It is measured in units
of the poll rate. For example, if KEYBOARD_DEBOUNCE_COUNT is defined as 2 and
KEY_DOWN_DELAY_SAMPLE_PERIOD is defined as 10, then the button debounce time will be 20
milliseconds. The default setting is '2'.
KEYBOARD_MULTIMEDIA_SUPPORT.
This configuration definition is used to selectively compile
support for multimedia (hot) keys. If this value is defined, then multimedia key support is compiled
into the executable image. If it is not defined, then the multimedia support code is omitted.
KEYBOARD_TEST_MODES.
This configuration definition is used to selectively compile code for
keyboard test modes. If this value is defined, then test modes are compiled into the executable
image. If it is not defined, then the test mode code is omitted. The test modes are described in sec-
tion Test Module.
KEYBOARD_TEST_MODE_PERIOD.
This configuration value sets the period that the keyboard
generates on test key presses. A key press consists of a scan code as the down key and a NULL as
the up key. The default value is 10 ms.
PANGRAM_TEST_MODE.
This configuration definition is used to selectively compile in the pan-
gram test mode. A pangram is a sentence that contains all of the letters of the alphabet at least
once.
KEYBOARD_BATTERY_VOLTAGE_SUPPORT.
This configuration definition is used to selectively
compile support for battery voltage level reporting. If this value is defined, then battery voltage level
reporting is compiled into the executable image. If it is not defined, then the battery voltage level
reporting code is omitted.
LP_RDK_KEYBOARD_MATRIX.
This configuration definition is used to selectively compile in the
keyboard matrix for the RDK keyboard hardware.
KEYBOARD_FAST_SCAN.
This configuration definition is used to selectively compile in the
Cypress Semiconductor fast scan algorithm. Fast Scan is used to minimize the time it takes for the
CPU to scan the key matrix which in turn reduces the current consumption.
KEYBOARD_TX_TIMEOUT.
This configuration value sets the maximum time that the keyboard
tries to send a report to the bridge. The default value is 5000 ms.
TIMER_CAL.
This configuration definition is used to selectively compile in the one-millisecond timer
calibration routine. The routine is called on power on and during protocol reconnect.
ENCRYPT_DATA.
This configuration definition is used to selectively compile in data encryption for
the keyboard. Contact Cypress Applications support for the encryption source code.
MFG_TEST_CODE.
This configuration definition is used to selectively compile in the manufacturing
test code. The manufacturing test code in this keyboard is compatible with the CY3631 Manufactur-
ing Test Kit offered by Cypress Semiconductor. See the mfgtest module for a description of how this
test mode is executed. See the CY3631 Manufacturing Test Kit documentation for a description of
the test operation.
MFG_ENTER_BY_PIN.
This configuration definition is used to select whether the manufacturing
test code is executed by connecting pin 4 and 5 on the ISP (programming) header. When this value
is not defined, then the manufacturing test code may be executed by holding the system sleep key
and the Bind button when the batteries are inserted into the keyboard.
