EN
Scan Measurement
Measurement conditions
The
i1
Pro measurement device supports multiple measurement conditions. Depending
on how you wish to scan a target for UV you need to measure each row of your test chart
either once or twice. In a single pass scan measurement and during the first pass of the
dual pass scan measurement, the patches are illuminated with the tungsten filament
lamp in the
i1
Pro device. If a second pass is required the patches are illuminated with a
UV LED during the measurement.
Single Pass Measurement is required for measurement condition
•
ISO 13655 M0 | Tungsten filament lamp with UV included (NoFilter)
Dual Pass Measurement is required for the following measurement conditions:
•
ISO 13655 M1 | D50
•
ISO 13655 M2 | Illumination with UV excluded (UVcut)
•
OBC | X-Rite Optical Brightener Compensation
The
Status Indicators on the
i1
Pro device guides you through the measurement
process.
Dual pass scan measurements require the aluminum ruler which includes the
reference required for the positioning sensor.
Virtual aperture technology
During a scan measurement the
i1
Pro device is performing 200 measurements per
second. The automatic patch detection of the device identifies useable measurements
made on a patch and unusable measurements made between two patches. Valid
measurements on a patch are averaged and the device reports the averaged result to
the software. Thanks to this technology the virtual aperture of the
i1
Pro device adapts to
the length of a patch. For best measurement results the length of the patches on your
test chart should be selected based on the resolution of your printer. For printers with
lower resolution or a grainy screening you should increase the length of the patches on
your test chart.
