EN
Specification
Spectral
engine:
i1
®
technology (holographic diffraction grating with 128 pixel diode array)
with built-in wavelengths check
Spectral range:
380 - 730 nm
Physical sampling interval:
3.5 nm
Optical resolution:
10 nm
Spectral reporting:
380 nm ... 730 nm in 10 nm steps
Measurement frequency in scanning
mode:
200 measurements per second
Optics:
Measurement geometry:
45º/0º ring illumination optics, ISO 13655:2009
Measurement aperture:
4.5 mm (0.18”) diameter
(effective measurement aperture during scanning is depending on the
patch size and measurement speed)
Illumination spot size:
3.5 mm (0.14”)
Light source:
Gas filled Tungsten (illuminant type A) and UV LED
Reflectance
measurement:
spectral reflectance [dimensionless]
Measurement conditions:
UV included - ISO 13655:2009 measurement condition M0
D50 - ISO 13655:2009 measurement condition M1
UV excluded Filter - ISO 13655:2009 measurement condition M2
OBC:
Optical Brightener Compensation (OBC) with i1Profiler software
Calibration:
Manual on external ceramic white reference
Measurement background:
white, ISO 13655:2009; for measurements on backup board
Maximal media thickness:
3 mm (0.12”) on backup board
Minimal patch size in scanning mode:
7 x 10 mm (0.28” x 0.39”) (Width x Height) with sensor ruler
10 x 10 mm (0.39” x 0.39”) (Width x Height) without sensor ruler
Inter-Instrument-Agreement:
0.4 ∆E94* average, 1.0 ∆E94* max.
(deviation from X-Rite manufacturing standard at a temperature of 23ºC
(73.4ºF) on 12 BCRA tiles (D50, 2º))
Short-term repeatability:
0.1 ∆E94* on white (D50,2°, mean of 10 measurements every 3 s on
white)
Emission
measurement:
spectral radiance [mW/nm/m
2
/sr], luminance [cd/m
2
]
Measurement range:
0.2 - 1200 cd/m
2
on a typical LCD-Monitor
Short-term repeatability:
x,y ±0.002 typ. (5000 K, 80 cd/m
2
)
Ambient light
measurement:
spectral irradiance [mW/nm/m
2
], illuminance [lux]
cosine corrected diffusor light measurement head
Interface:
USB 1.1
