LISA-C2 series and FW75-C200 - System Integration Manual
UBX-13000620 - R21
Early Production Information
Design-In
Page 67 of 103
External Antenna Enclosure
Application Board
LISA-C200 or
FW75-C200
ANT
Radiating
Element
Zo = 50 Ohm
Coaxial Antenna Cable
Antenna Port
Enclosure Port
C
L
Figure 38: Antenna port ESD immunity protection application circuit
Reference
Description
Part Number - Manufacturer
C
15 pF Capacitor Ceramic C0G 0402 5% 50 V
GRM1555C1H150JA01 - Murata
L
39 nH Multilayer Chip Inductor L0G 0402 5%
LQG15HN39NJ02 - Murata
Table 35: Example of components for Antenna port ESD protection application circuit
2.5.3
Module interfaces precautions
All the module pins that are externally accessible should be included in the ESD immunity test since they are
considered to be a port as defined in [13]. Depending on applicability, and in order to satisfy ESD immunity test
requirements and ESD category level, pins connected to the port should be protected up to +4 kV / -4 kV for
direct Contact Discharge, and up to +8 kV / -8 kV for Air Discharge applied to the enclosure surface.
The maximum ESD sensitivity rating of all the pins of the module, except the
ANT
pin, is 1 kV (Human Body
Model according to JESD22-A114F). A higher protection level can be achieved by mounting an ESD protection
(e.g. EPCOS CA05P4S14THSG varistor array or CT0402S14AHSG).
For the USB interface a very low capacitance (i.e. less or equal to 1 pF) ESD protection (e.g. Tyco Electronics
PESD0402-140 ESD protection device) can be mounted on the lines connected to
USB_D+
and
USB_D-
pins.
For the SIM interface a low capacitance (i.e. less than 10 pF) ESD protection (e.g. Infineon ESD8V0L2B-03L or
AVX USB0002) must be placed near the SIM card holder on each line (
VSIM
,
SIM_IO
,
SIM_CLK
,
SIM_RST
).