Toshiba TA1218F, Руководство пользователя

Страница: 31 / 40

TA1218N/F
2000-09-11 31/40
Characteristics Select Mode Symbol
Test
Circuit
Min. Typ. Max. Unit Test Method
V
in
TV F7C

10
 
MHz
V
in
V1 F10C

10
 
MHz
V
in
V2 F28C

10
 
MHz
Y/V
in
S1 F12C

10
 
MHz
C
in
S1 F14C

10
 
MHz
Y/V
in
S2 F16C

10
 
MHz
C
in
S2 F18C

10
 
MHz
C
out
Frequency response
C
in
F32C

10
 
MHz
(1) Apply a 1.0 V
p-p
sine wave to each
input pin.
(2) In each select
mode, measure a
frequency at which
the output
amplitude on pin
34 is 3dB down
from the 15 kHz
applied level.
V
in
TV CT7C

55 60

dB
V
in
V1 CT10C

55 60

dB
V
in
V2 CT28C

55 60

dB
Y/V
in
S1 CT12C

55 60

dB
C
in
S1 CT14C

55 60

dB
Y/V
in
S2 CT16C

55 60

dB
C
in
S2 CT18C

55 60

dB
C
out
Crosstalk
C
in
CT32C

55 60

dB
(1) Apply a 3.58 MHz,
1.0 V
p-p
sine wave
to each input pin.
(2) In each select
mode, compare
signal output from
the selected pin
with leakage
components from
nonselected pins
to find a crosstalk.
V
in
TV VDR7D

5.0 5.5

V
V
in
V1 VDR10D

5.0 5.5

V
V
in
V2 VDR28D

5.0 5.5

V
Y/V
in
S1 VDR12D

5.0 5.5

V
V
out1
VDR38D

1.5 2.0

V
V
out2
VDR42D

1.5 2.0

V
Y
out
VDR36D

1.2 1.8

V
Det select
Input dynamic range
C
out
VDR34D

1.2 1.8

V
(1) Apply a 15 kHz
sine wave to each
input pin.
(2) In each select
mode, measure an
input amplitude at
which the output
waveform on pin 4
(46) begins to be
distorted.
V
in
TV G7D
 −
0.5 0 0.5 dB
V
in
V1 G10D
 −
0.5 0 0.5 dB
V
in
V2 G28D
 −
0.5 0 0.5 dB
Y/V
in
S1 G12D
 −
0.5 0 0.5 dB
V
out1
G38D
 −
0.1 0 0.1 dB
V
out2
G42D
 −
0.1 0 0.1 dB
Y
out
G36D
 −
0.1 0 0.1 dB
Det select
Gain
C
out
G34D
 −
0.1 0 0.1 dB
(1) Apply a 15 kHz,
1.0 V
p-p
sine wave
to each input pin.
(2) In each select
mode, find the gain
between input and
output.