Toshiba TA1218F, Руководство пользователя

Страница: 34 / 40

TA1218N/F
2000-09-11 34/40
Characteristics Select Mode Symbol
Test
Circuit
Min. Typ. Max. Unit Test Method
L
in
TV VDR5L2

6.0 6.5

V
p-p
L
in
V1 VDR8L2

6.0 6.5

V
p-p
L
in
V2 VDR29L2

6.0 6.5

V
p-p
L
in
S1 VDR11L2

6.0 6.5

V
p-p
L
out
2
Input dynamic range
L
in
S2 VDR15L2

6.0 6.5

V
p-p
(1) Apply a 1 kHz sine
wave to each input
pin.
(2) In each select
mode, measure an
input amplitude at
which the output
waveform on pin 1
begins to be
distorted.
L
in
TV G5L2
 −
0.5 0 0.5 dB
L
in
V1 G8L2
 −
0.5 0 0.5 dB
L
in
V2 G29L2
 −
0.5 0 0.5 dB
L
in
S1 G11L2
 −
0.5 0 0.5 dB
L
out
2
Gain
L
in
S2 G15L2
 −
0.5 0 0.5 dB
(1) Apply a 1 kHz,
1.0 V
p-p
sine wave
to each input pin.
(2) In each select
mode, find the gain
between input and
output.
L
in
TV F5L2

0.1 2.0

MHz
L
in
V1 F8L2

0.1 2.0

MHz
L
in
V2 F29L2

0.1 2.0

MHz
L
in
S1 F11L2

0.1 2.0

MHz
L
out
2
Frequency response
L
in
S2 F15L2

0.1 2.0

MHz
(1) Apply a 1.0 V
p-p
sine wave to each
input pin.
(2) In each select
mode, measure a
frequency at which
the output
amplitude on pin 1
is 3dB down from
the 1 kHz applied
level.
L
in
TV CT5L2

70 100

dB
L
in
V1 CT8L2

70 100

dB
L
in
V2 CT29L2

70 100

dB
L
in
S1 CT11L2

70 100

dB
L
out
2
Crosstalk
L
in
S2 CT15L2

70 100

dB
(1) Apply a 1 kHz,
1.0 V
p-p
sine wave
to each input pin.
(2) In each select
mode, compare
signal output from
the selected pin
with leakage
components from
nonselected pins
to find a crosstalk.
L
in
TV M5L2

70 100

dB
L
in
V1 M8L2

70 100

dB
L
in
V2 M29L2

70 100

dB
L
in
S1 M11L2

70 100

dB
L
out
2
Mute attenuation
L
in
S2 M15L2

70 100

dB
(1) Apply a 1 kHz,
1.0 V
p-p
sine wave
to each input pin.
(2) In each select
mode, compare
the output
amplitudes on pin
1 (43) when mute
is turned on and
turned off to find
mute attenuation.