Toshiba TA1218F, Руководство пользователя

Страница: 32 / 40

TA1218N/F
2000-09-11 32/40
Characteristics Select Mode Symbol
Test
Circuit
Min. Typ. Max. Unit Test Method
L
in
TV VDR5L1

6.0 6.5

V
p-p
L
in
V1 VDR8L1

6.0 6.5

V
p-p
L
in
V2 VDR29L1

6.0 6.5

V
p-p
L
in
S1 VDR11L1

6.0 6.5

V
p-p
L
out
1
Input dynamic range
L
in
S2 VDR15L1

6.0 6.5

V
p-p
(1) Apply a 1 kHz sine
wave to each input
pin.
(2) In each select
mode, measure an
input amplitude at
which the output
waveform on pin
37 (37) begins to
be distorted.
L
in
TV G5L1
 −
0.5 0 0.5 dB
L
in
V1 G8L1
 −
0.5 0 0.5 dB
L
in
V2 G29L1
 −
0.5 0 0.5 dB
L
in
S1 G11L1
 −
0.5 0 0.5 dB
L
out
1
Gain
L
in
S2 G15L1
 −
0.5 0 0.5 dB
(1) Apply a 1 kHz,
1.0 V
p-p
sine wave
to each input pin.
(2) In each select
mode, find the gain
between input and
output.
L
in
TV F5L1

0.1 2.0

MHz
L
in
V1 F8L1

0.1 2.0

MHz
L
in
V2 F29L1

0.1 2.0

MHz
L
in
S1 F11L1

0.1 2.0

MHz
L
out
1
Frequency response
L
in
S2 F15L1

0.1 2.0

MHz
(1) Apply a 1.0 V
p-p
sine wave to each
input pin.
(2) In each select
mode, measure a
frequency at which
the output
amplitude on pin
37 is 3dB down
from the 1 kHz
applied level.
L
in
TV CT5L1

70 100

dB
L
in
V1 CT8L1

70 100

dB
L
in
V2 CT29L1

70 100

dB
L
in
S1 CT11L1

70 100

dB
L
out
1
Crosstalk
L
in
S2 CT15L1

70 100

dB
(1) Apply a 1 kHz,
1.0 V
p-p
sine wave
to each input pin.
(2) In each select
mode, compare
signal output from
the selected pin
with leakage
components from
nonselected pins
to find a crosstalk.
L
in
TV M5L1

70 100

dB
L
in
V1 M8L1

70 100

dB
L
in
V2 M29L1

70 100

dB
L
in
S1 M11L1

70 100

dB
L
out
1
Mute attenuation
L
in
S2 M15L1

70 100

dB
(1) Apply a 1 kHz,
1.0 V
p-p
sine wave
to each input pin.
(2) In each select
mode, compare
the output
amplitudes on pin
37 (37) when mute
is turned on and
turned off to find
mute attenuation.